Extracting viscoelastic material parameters using an atomic force microscope and static force spectroscopy
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- Extent
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Online-Ressource
- Language
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Englisch
- Bibliographic citation
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Extracting viscoelastic material parameters using an atomic force microscope and static force spectroscopy ; volume:11 ; pages:922-937
Beilstein journal of nanotechnology ; 11, 922-937
- Classification
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Ingenieurwissenschaften und Maschinenbau
- DOI
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10.3762/bjnano.11.77
- URN
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urn:nbn:de:101:1-2020120315344805054854
- Rights
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Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
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15.08.2025, 7:22 AM CEST
Data provider
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An atomic force microscope integrated with a helium ion microscope for correlative nanoscale characterization
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