Systematic analysis of the impact of line-edge roughness on the X-ray scattering pattern
- Alternative title
-
Systematische Analyse des Einflusses der Linienkantenrauigkeit auf das Röntgenstreuungsmuster
- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- Extent
-
Online-Ressource
- Language
-
Englisch
- Notes
-
Berlin, Technische Universität Berlin, Dissertation, 2021
- Keyword
-
Example
Impact
X-rays--Scattering
- Event
-
Veröffentlichung
- (where)
-
Berlin
- (who)
-
Technische Universität Berlin
- (when)
-
2021
- Creator
- Contributor
-
Richter, Mathias
Eisebitt, Stefan
Richter, Mathias
Kato, Akiko
- DOI
-
10.14279/depositonce-12320
- Handle
-
11303/13537
- URN
-
urn:nbn:de:101:1-2021092202030068973979
- Rights
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
25.03.2025, 1:50 PM CET
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Fernández Herrero, Analía
- Richter, Mathias
- Eisebitt, Stefan
- Kato, Akiko
- Technische Universität Berlin
Time of origin
- 2021
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