Systematic analysis of the impact of line-edge roughness on the X-ray scattering pattern
- Weitere Titel
-
Systematische Analyse des Einflusses der Linienkantenrauigkeit auf das Röntgenstreuungsmuster
- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
-
Online-Ressource
- Sprache
-
Englisch
- Anmerkungen
-
Berlin, Technische Universität Berlin, Dissertation, 2021
- Schlagwort
-
Example
Impact
X-rays--Scattering
- Ereignis
-
Veröffentlichung
- (wo)
-
Berlin
- (wer)
-
Technische Universität Berlin
- (wann)
-
2021
- Urheber
- Beteiligte Personen und Organisationen
-
Richter, Mathias
Eisebitt, Stefan
Kato, Akiko
- DOI
-
10.14279/depositonce-12320
- Handle
-
11303/13537
- URN
-
urn:nbn:de:101:1-2021092202030068973979
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
15.08.2025, 07:35 MESZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
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Beteiligte
- Fernández Herrero, Analía
- Richter, Mathias
- Eisebitt, Stefan
- Kato, Akiko
- Technische Universität Berlin
Entstanden
- 2021
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