Comprehensive analysis of current leakage at individual screw and mixed threading dislocations in freestanding GaN substrates

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Location: Deutsche Nationalbibliothek Frankfurt am Main

ISSN: 2045-2322

Extent: Online-Ressource

Language: Englisch

Notes: online resource.

Bibliographic citation: Comprehensive analysis of current leakage at individual screw and mixed threading dislocations in freestanding GaN substrates ; volume:13 ; number:1 ; day:10 ; month:2 ; year:2023 ; pages:1-14 ; date:12.2023
Scientific reports ; 13, Heft 1 (10.2.2023), 1-14, 12.2023

Creator: Hamachi, Takeaki
Tohei, Tetsuya
Hayashi, Yusuke
Imanishi, Masayuki
Usami, Shigeyoshi
Mori, Yusuke
Sakai, Akira

Contributor: SpringerLink (Online service)

DOI: 10.1038/s41598-023-29458-3

URN: urn:nbn:de:101:1-2023041421285078889263

Rights: Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.

Last update: 14.08.2025, 10:52 AM CEST

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Hamachi, Takeaki
Tohei, Tetsuya
Hayashi, Yusuke
Imanishi, Masayuki
Usami, Shigeyoshi
Mori, Yusuke
Sakai, Akira
SpringerLink (Online service)

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Comprehensive analysis of current leakage at individual screw and mixed threading dislocations in freestanding GaN substrates

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Other Objects (12)

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