Extended Barrier Lifetime of Partially Cracked Organic/Inorganic Multilayers for Compliant Implantable Electronics
- Standort
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Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
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Online-Ressource
- Sprache
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Englisch
- Erschienen in
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Extended Barrier Lifetime of Partially Cracked Organic/Inorganic Multilayers for Compliant Implantable Electronics ; day:03 ; month:09 ; year:2021 ; extent:10
Small ; (03.09.2021) (gesamt 10)
- Urheber
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Kim, Kyungjin
Van Gompel, Matthias
Wu, Kangling
Schiavone, Giuseppe
Carron, Julien
Bourgeois, Florian
Lacour, Stéphanie P.
Leterrier, Yves
- DOI
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10.1002/smll.202103039
- URN
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urn:nbn:de:101:1-2021090315164262932881
- Rechteinformation
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Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
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15.08.2025, 07:33 MESZ
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Beteiligte
- Kim, Kyungjin
- Van Gompel, Matthias
- Wu, Kangling
- Schiavone, Giuseppe
- Carron, Julien
- Bourgeois, Florian
- Lacour, Stéphanie P.
- Leterrier, Yves
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