The role of defects in fluorescent silicon carbide layers grown by sublimation epitaxy
- Standort
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Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
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Online-Ressource
- Sprache
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Englisch
- Erschienen in
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In: IOP Conference Series Materials Science and Engineering 56.1 (2014): 01.04.2014
- Klassifikation
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Physik
- Schlagwort
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- Ereignis
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Veröffentlichung
- (wo)
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Erlangen
- (wer)
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Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU)
- (wann)
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2014
- Beteiligte Personen und Organisationen
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Schimmel, Saskia
Kaiser, Michl
Jokubavicius, V.
Ou, Y.
Hens, P.
Linnarsson, M. K.
Sun, J.
Liljedahl, R.
Ou, H.
Syväjärvi, M.
Wellmann, Peter
- URN
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urn:nbn:de:bvb:29-opus4-44345
- Rechteinformation
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Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
25.03.2025, 13:56 MEZ
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Beteiligte
- Schimmel, Saskia
- Kaiser, Michl
- Jokubavicius, V.
- Ou, Y.
- Hens, P.
- Linnarsson, M. K.
- Sun, J.
- Liljedahl, R.
- Ou, H.
- Syväjärvi, M.
- Wellmann, Peter
- Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU)
Entstanden
- 2014
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