- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
-
Online-Ressource
- Sprache
-
Englisch
- Anmerkungen
-
In: New frontiers in testing : proceedings. Washington, DC : IEEE Computer Soc. Pr., 1988. - ISBN 0-8186-0870-6, S. 236-244. URL http://dx.doi.org./10.1109/TEST.1988.207808
- Klassifikation
-
Elektrotechnik, Elektronik
- Schlagwort
-
Fehlererkennung ; Integrierte Schaltung ; Testbarkeit
- Ereignis
-
Veröffentlichung
- (wo)
-
Stuttgart
- (wer)
-
Universitätsbibliothek der Universität Stuttgart
- (wann)
-
2012
- Urheber
- URN
-
urn:nbn:de:bsz:93-opus-73417
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
25.03.2025, 13:48 MEZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Beteiligte
- Wunderlich, Hans-Joachim
- Universitätsbibliothek der Universität Stuttgart
Entstanden
- 2012
Ähnliche Objekte (12)
Multiple distributions for biased random test patterns
Weighted random patterns with multiple distributions
Hybrid biased random sampling for multiple resourse-constrained project scheduling problems
Tail expansions for random record distributions
Factor-Biased Technical Change and Specialization Patterns
Factor-biased technical change and specialization patterns
Random distributions and random migration in homeostasis and immune responses
Parameterized heuristics for project scheduling: Biased random sampling methods
Work distributions for random sudden quantum quenches
Dynamic probabilistic constraints under continuous random distributions
Distributions of order patterns in time series
Spatial patterns and size distributions of cities
Multiple distributions for biased random test patterns
Weighted random patterns with multiple distributions
Hybrid biased random sampling for multiple resourse-constrained project scheduling problems
Tail expansions for random record distributions
Factor-Biased Technical Change and Specialization Patterns
Factor-biased technical change and specialization patterns
Random distributions and random migration in homeostasis and immune responses
Parameterized heuristics for project scheduling: Biased random sampling methods
Work distributions for random sudden quantum quenches
Dynamic probabilistic constraints under continuous random distributions
Distributions of order patterns in time series
Spatial patterns and size distributions of cities
Multiple distributions for biased random test patterns
Weighted random patterns with multiple distributions
Hybrid biased random sampling for multiple resourse-constrained project scheduling problems
Tail expansions for random record distributions
Factor-Biased Technical Change and Specialization Patterns
Factor-biased technical change and specialization patterns
Random distributions and random migration in homeostasis and immune responses
Parameterized heuristics for project scheduling: Biased random sampling methods
Work distributions for random sudden quantum quenches
Dynamic probabilistic constraints under continuous random distributions
Distributions of order patterns in time series