Reliability Assessment and Defect Characterization of Piezoelectric Thin Films
- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
-
Online-Ressource
- Sprache
-
Englisch
- Anmerkungen
-
Chemnitz, Technische Universität Chemnitz, Dissertation, 2024
- Schlagwort
-
Zuverlässigkeit
Dünne Schicht
PZT
Piezoelektrizität
Degradation
Ferroelektrikum
Zuverlässigkeit
PZT
Kaliumnatriumniobat
Gitterleerstelle
- Ereignis
-
Veröffentlichung
- (wo)
-
Chemnitz
- (wer)
-
Technische Universität Chemnitz
- (wann)
-
2024
- Urheber
- Beteiligte Personen und Organisationen
-
Hiller, Karla
Dörr, Kathrin
- URN
-
urn:nbn:de:bsz:ch1-qucosa2-939082
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
15.08.2025, 07:37 MESZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
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Beteiligte
- Ho, Kuan-Ting
- Hiller, Karla
- Dörr, Kathrin
- Technische Universität Chemnitz
Entstanden
- 2024
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