- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISBN
-
9783832217785
3832217789
- Maße
-
21 cm, 140 gr.
- Umfang
-
83 S.
- Sprache
-
Englisch
- Anmerkungen
-
graph. Darst.
Zugl.: Hannover, Univ., Diss., 2002
- Schlagwort
-
Fehlersimulation
Analogschaltung
Transistorschaltung
Testmustergenerierung
Spezifikationstechnik
Schaltungsanalyse
Testing
- Inhaltsverzeichnis
- Rechteinformation
-
Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
- Letzte Aktualisierung
-
11.06.2025, 13:39 MESZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Objekttyp
- Hochschulschrift
Beteiligte
- Dhifi, Mustapha
- Shaker
Entstanden
- 2003
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