Analysis of doping concentration and composition in wide bandgap AlGaN:Si by wavelength dispersive x-ray spectroscopy
- Standort
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Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
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Online-Ressource
- Sprache
-
Englisch
- Erschienen in
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In: Semiconductor Science and Technology (32:3) - Bristol : IOP - Art.-Id. 035020
- Ereignis
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Veröffentlichung
- (wo)
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Berlin
- (wer)
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Technische Universität Berlin
- (wann)
-
2022
- Urheber
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Kusch, Gunnar
Mehnke, Frank
Enslin, Johannes
Edwards, Paul R.
Wernicke, Tim
Kneissl, Michael
Martin, Robert W.
- DOI
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10.14279/depositonce-15151
- Handle
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11303/16375
- URN
-
urn:nbn:de:101:1-2022021601050814052036
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
15.08.2025, 07:24 MESZ
Datenpartner
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Beteiligte
- Kusch, Gunnar
- Mehnke, Frank
- Enslin, Johannes
- Edwards, Paul R.
- Wernicke, Tim
- Kneissl, Michael
- Martin, Robert W.
- Technische Universität Berlin
Entstanden
- 2022
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