Infrared ellipsometry on semiconductor layer structures : phonons, plasmons, and polaritons

The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy. This book offers basic insights into the concepts of phonons, plasmons and polaritons, and the infrared dielectric function of semiconductors in layered structures. It describes how strain, composition, and the state of the atomic order within complex layer structures of multinary alloys can be determined from an infrared ellipsometry examination. Special emphasis is given to free-charge-carrier properties, and magneto-optical effects. A broad range of experimental examples are described, including multinary alloys of zincblende and wurtzite structure semiconductor materials, and applications to organic layer structures are explored. TOC:Introduction.- Ellipsometry.- Infrared Model Dielectric Functions.- Polaritons in Semiconductor Layer Structures.- Anisotropic Substrates.- Zinsblende-Structure Materials (III-V).- Wurtzite-Structure Materials (Group-III Nitrides, ZnO).- Magneto-optic Ellipsometry

Object Details

• Location: Deutsche Nationalbibliothek Frankfurt am Main
• ISBN: 9783540232490 ; 3540232494
• Dimensions: 24 cm
• Extent: XI, 193 S.
• Language: Englisch
• Notes: Ill., graph. Darst. ; Literaturangaben

References and Relationships

• Bibliographic citation: Springer tracts in modern physics ; Vol. 209

Classification and Topics

• Classification: Physik
• Keyword: Halbleiter ; Mehrschichtsystem ; Dielektrische Funktion ; Ellipsometrie ; Infrarot

Contributors, Places and Time

• Event: Veröffentlichung
• (where): Berlin, Heidelberg, New York
• (who): Springer
• (when): 2004
• Creator: Schubert, Mathias

Further information

• Table of contents: https://d-nb.info/972434046/04
• Rights: Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
• Last update: 11.06.2025, 2:23 PM CEST