The Debye–Scherrer technique – rapid detection for applications

Abstract: The Debye–Scherrer (DS) technique is a common technique for determining spacings in atomic layers by X-ray diffraction. The spacings of the atomic layers are proportional to the macroscopic stress in the radiated area. When a crystalline powder is irradiated with X-rays, the diffracted X-rays produce a ring that photographic films detect. Afterward, the film is developed to reveal the rings. Earlier, this procedure took lots of time. With upcoming multiple wavelength anomalous dispersion-detectors, a very sensitive area detector, DS rings can be detected and analyzed in minutes. This allows for the rapid determination of residual stresses prior to inspection in a production environment. Additional information from the intensity distribution within the ring can be obtained. A description of the new technique is given.

Object Details

• Location: Deutsche Nationalbibliothek Frankfurt am Main
• Extent: Online-Ressource
• Language: Englisch

References and Relationships

• Bibliographic citation: The Debye–Scherrer technique – rapid detection for applications ; volume:20 ; number:1 ; year:2022 ; pages:888-890 ; extent:3 ; Open physics ; 20, Heft 1 (2022), 888-890 (gesamt 3)

Contributors, Places and Time

• Creator: Mueller, Eckehard

Further information

• DOI: 10.1515/phys-2022-0193
• URN: urn:nbn:de:101:1-2022091714064004564529
• Rights: Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
• Last update: 15.08.2025, 7:26 AM CEST