Hat mitgewirkt an:
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Speckleinterferometrie zur Topografiebestimmung an optisch rauhen Oberflächen
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Contouring using two-wavelength electronic speckle pattern interferometry employing dual-beam illuminations
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Contouring by modified dual-beam ESPI based on tilting illumination beams
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A novel approach to determine decorrelation effect in a dual-beam electronic speckle pattern interferometer