Monografie
High resolution three-dimensional reciprocal space mapping of semiconductor nanostructures
- Sprache
-
Englisch
- Umfang
-
S. 1682 - 1935
- Identifier
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997687916
- Reihe
-
Physica status solidi : A, Applications and materials science; 206, No. 8, Special issue
Thema
Röntgenstrukturanalyse ; Kristallstrukturanalyse; Konferenzschrift; Aufsatzsammlung
Beteiligte Personen und Organisationen
- Inhaltsverzeichnis
- Rechteinformation
-
Der Zugriff auf Teile des Objekts ist unbeschränkt möglich.
- Letzte Aktualisierung
-
16.08.2023, 18:25 MESZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Objekttyp
- Monografie
Beteiligte
- Stangl, Julian
- Mariager, Simon O.
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