X-ray absorption spectroscopy by full-field X-ray microscopy of a thin graphite flake: Imaging and electronic structure via the carbon K-edge

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Location: Deutsche Nationalbibliothek Frankfurt am Main

Extent: Online-Ressource

Bibliographic citation: X-ray absorption spectroscopy by full-field X-ray microscopy of a thin graphite flake: Imaging and electronic structure via the carbon K-edge ; volume:3 ; pages:345-350
Beilstein journal of nanotechnology ; 3, 345-350

Classification: Ingenieurwissenschaften und Maschinenbau

DOI: 10.3762/bjnano.3.39

URN: urn:nbn:de:101:1-201210164131

Rights: Der Zugriff auf das Objekt ist unbeschränkt möglich.

Last update: 15.08.2025, 7:29 AM CEST

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X-ray absorption spectroscopy by full-field X-ray microscopy of a thin graphite flake: Imaging and electronic structure via the carbon K-edge

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