- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
-
Online-Ressource
- Sprache
-
Englisch
- Anmerkungen
-
In: SPIE Optical Metrology. Munich, 25.-29. June 2017
In: Optical Measurement Systems for Industrial Inspection X, Herausgeber: Peter Lehmann, Herausgeber: Wolfgang Osten, Erscheinungsort: Bellingham, Wash., Verlag: SPIE, Erscheinungsjahr: 2017, Titel Schriftenreihe: Proceedings of SPIE, Bandnummer Schriftenreihe: 10329
- Klassifikation
-
Ingenieurwissenschaften und Maschinenbau
- Ereignis
-
Veröffentlichung
- (wo)
-
Dresden
- (wer)
-
Technische Universität Dresden
- (wann)
-
2019
- Urheber
-
Bermuske, Mike
Büttner, Lars
Czarske, Jürgen
- URN
-
urn:nbn:de:bsz:14-qucosa2-351511
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
25.03.2025, 13:51 MEZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
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Beteiligte
- Bermuske, Mike
- Büttner, Lars
- Czarske, Jürgen
- Technische Universität Dresden
Entstanden
- 2019
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