Longitudinal bunch diagnostics in the Terahertz domain at TELBE using fast room temperature operable zero-bias Schottky diodes
- Standort
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Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
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Online-Ressource
- Sprache
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Englisch
- Anmerkungen
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In: Longitudinal bunch diagnostics in the Terahertz domain at TELBE using fast room temperature operable zero-bias Schottky diodes, IBIC2024-13th International Beam Instrumentation Conference, JACoW Publishing, ISBN 978-3-95450-249-3
- Ereignis
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Veröffentlichung
- (wo)
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Darmstadt
- (wer)
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Universitäts- und Landesbibliothek
- (wann)
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2025
- Urheber
- DOI
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10.26083/tuprints-00028654
- URN
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urn:nbn:de:tuda-tuprints-286548
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
15.08.2025, 07:31 MESZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
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Beteiligte
- Yadav, Rahul
- Kuntzsch, Michael
- Penirschke, Andreas
- Preu, Sascha
- Universitäts- und Landesbibliothek
Entstanden
- 2025
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