Stress-induced expression of IPT gene in transgenic wheat reduces grain yield penalty under drought
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- ISSN
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2090-5920
- Extent
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Online-Ressource
- Language
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Englisch
- Notes
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online resource.
- Bibliographic citation
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Stress-induced expression of IPT gene in transgenic wheat reduces grain yield penalty under drought ; volume:19 ; number:1 ; day:10 ; month:5 ; year:2021 ; pages:1-17 ; date:12.2021
Journal of Genetic Engineering and Biotechnology ; 19, Heft 1 (10.5.2021), 1-17, 12.2021
- Creator
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Beznec, Ailin
Faccio, Paula
Miralles, Daniel J.
Abeledo, Leonor G.
Oneto, Cecilia Decima
Garibotto, María de Belén
Gonzalez, Germán
Moreyra, Federico
Elizondo, Matías
Ruíz, Mónica
Lewi, Dalia
Blumwald, Eduardo
Llorente, Berta
Paleo, Antonio Díaz
Bossio, Ezequiel
- Contributor
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SpringerLink (Online service)
- DOI
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10.1186/s43141-021-00171-w
- URN
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urn:nbn:de:101:1-2021091120271471228721
- Rights
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Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
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15.08.2025, 7:26 AM CEST
Data provider
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Beznec, Ailin
- Faccio, Paula
- Miralles, Daniel J.
- Abeledo, Leonor G.
- Oneto, Cecilia Decima
- Garibotto, María de Belén
- Gonzalez, Germán
- Moreyra, Federico
- Elizondo, Matías
- Ruíz, Mónica
- Lewi, Dalia
- Blumwald, Eduardo
- Llorente, Berta
- Paleo, Antonio Díaz
- Bossio, Ezequiel
- SpringerLink (Online service)