Integration and High-Temperature Characterization of Ferroelectric Vanadium-Doped Bismuth Titanate Thin Films on Silicon Carbide
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- ISSN
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1543-186X
- Extent
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Online-Ressource
- Language
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Englisch
- Notes
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online resource.
- Bibliographic citation
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Integration and High-Temperature Characterization of Ferroelectric Vanadium-Doped Bismuth Titanate Thin Films on Silicon Carbide ; day:20 ; month:3 ; year:2017 ; pages:1-7
Journal of electronic materials ; (20.3.2017), 1-7
- Classification
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Physik
- Creator
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Ekström, Mattias
- Contributor
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Khartsev, Sergiy
Östling, Mikael
Zetterling, Carl-Mikael
SpringerLink (Online service)
- DOI
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10.1007/s11664-017-5447-3
- URN
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urn:nbn:de:1111-2017040912178
- Rights
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
14.08.2025, 10:52 AM CEST
Data provider
This object is provided by:
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Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Ekström, Mattias
- Khartsev, Sergiy
- Östling, Mikael
- Zetterling, Carl-Mikael
- SpringerLink (Online service)
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