In Situ Coupling Applied Voltage and Synchrotron Radiation: Operando Characterization of Transistors

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Location: Deutsche Nationalbibliothek Frankfurt am Main

ISSN: 1556-276X

Extent: Online-Ressource

Language: Englisch

Notes: online resource.

Bibliographic citation: In Situ Coupling Applied Voltage and Synchrotron Radiation: Operando Characterization of Transistors ; volume:17 ; number:1 ; day:2 ; month:2 ; year:2022 ; pages:1-10 ; date:12.2022
Nanoscale research letters ; 17, Heft 1 (2.2.2022), 1-10, 12.2022

Creator: Davydok, Anton
Luponosov, Yuriy N.
Ponomarenko, Sergey A.
Grigorian, Souren

Contributor: SpringerLink (Online service)

DOI: 10.1186/s11671-022-03662-y

URN: urn:nbn:de:101:1-2022051120121353458246

Rights: Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.

Last update: 15.08.2025, 7:36 AM CEST

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Davydok, Anton
Luponosov, Yuriy N.
Ponomarenko, Sergey A.
Grigorian, Souren
SpringerLink (Online service)

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In Situ Coupling Applied Voltage and Synchrotron Radiation: Operando Characterization of Transistors

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Other Objects (12)

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