On the frequency dependence of viscoelastic material characterization with intermittent-contact dynamic atomic force microscopy: avoiding mischaracterization across large frequency ranges

Location
Deutsche Nationalbibliothek Frankfurt am Main
Extent
Online-Ressource
Language
Englisch

Bibliographic citation
On the frequency dependence of viscoelastic material characterization with intermittent-contact dynamic atomic force microscopy: avoiding mischaracterization across large frequency ranges ; volume:11 ; pages:1409-1418
Beilstein journal of nanotechnology ; 11, 1409-1418

Classification
Ingenieurwissenschaften und Maschinenbau

DOI
10.3762/bjnano.11.125
URN
urn:nbn:de:101:1-2020120316444684587274
Rights
Der Zugriff auf das Objekt ist unbeschränkt möglich.
Last update
15.08.2025, 7:35 AM CEST

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