Konferenzschrift | Kongress
Requirements and recent development in high precision length metrology
- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISBN
-
9783897018419
3897018411
- Maße
-
30 cm
- Umfang
-
235 S.
- Sprache
-
Englisch
- Anmerkungen
-
Ill., graph. Darst.
- Erschienen in
-
Vorträge des ... PTB-Seminars / Physikalisch-Technische Bundesanstalt ; 159
- Schlagwort
-
Komparator
Präzisionsmessung
Nanometerbereich
- Ereignis
-
Veröffentlichung
- (wo)
-
Bremerhaven
- (wer)
-
Wirtschaftsverl. NW, Verl. für Neue Wiss.
- (wann)
-
2001
- Beteiligte Personen und Organisationen
- Inhaltsverzeichnis
- Rechteinformation
-
Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
- Letzte Aktualisierung
-
11.03.2025, 12:12 MEZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Objekttyp
- Konferenzschrift
- Kongress
Beteiligte
- Bosse, Harald
- Physikalisch-Technische Bundesanstalt. Abteilung Thermodynamik und Explosionsschutz
- Wirtschaftsverl. NW, Verl. für Neue Wiss.
Entstanden
- 2001
Ähnliche Objekte (12)
Ongoing trends in precision metrology
Optical metrology for precision engineering
Metrology compact for precision measuring instruments
Advanced mirror concepts for high-precision metrology
Development of a test setup for the characterization of an optical microscope for high precision length metrology applications
Design of a high-precision microgear metrology system
Machine Learning-Driven Design in High-Precision Optical Metrology
Optical parametric oscillators for precision IR spectroscopy and metrology
Thermal noise of multiscale optical systems for high-precision metrology
Transmission digital holography for high-precision non-destructive imaging and metrology
Frequency metrology tools for high-precision spectroscopy of molecular hydrogen ions
Industrial metrology for the aviation industry : technologies, strategies and regulatory requirements
Ongoing trends in precision metrology
Optical metrology for precision engineering
Metrology compact for precision measuring instruments
Advanced mirror concepts for high-precision metrology
Development of a test setup for the characterization of an optical microscope for high precision length metrology applications
Design of a high-precision microgear metrology system
Machine Learning-Driven Design in High-Precision Optical Metrology
Optical parametric oscillators for precision IR spectroscopy and metrology
Thermal noise of multiscale optical systems for high-precision metrology
Transmission digital holography for high-precision non-destructive imaging and metrology
Frequency metrology tools for high-precision spectroscopy of molecular hydrogen ions
Industrial metrology for the aviation industry : technologies, strategies and regulatory requirements
Ongoing trends in precision metrology
Optical metrology for precision engineering
Metrology compact for precision measuring instruments
Advanced mirror concepts for high-precision metrology
Development of a test setup for the characterization of an optical microscope for high precision length metrology applications
Design of a high-precision microgear metrology system
Machine Learning-Driven Design in High-Precision Optical Metrology
Optical parametric oscillators for precision IR spectroscopy and metrology
Thermal noise of multiscale optical systems for high-precision metrology
Transmission digital holography for high-precision non-destructive imaging and metrology
Frequency metrology tools for high-precision spectroscopy of molecular hydrogen ions