Modulation of Exchange Bias in La 0.35 Sr 0.65 MnO 3/La 0.7 Sr 0.3 MnO 3 through Volatile Polarization of P (VDF‐TrFE) Gate Dielectric

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Location
Deutsche Nationalbibliothek Frankfurt am Main
Extent
Online-Ressource
Language
Englisch

Bibliographic citation
Modulation of Exchange Bias in La 0.35 Sr 0.65 MnO 3/La 0.7 Sr 0.3 MnO 3 through Volatile Polarization of P (VDF‐TrFE) Gate Dielectric ; day:20 ; month:07 ; year:2023 ; extent:9
Advanced materials interfaces ; (20.07.2023) (gesamt 9)

Creator
Zhao, Xu Wen
Wong, Hon Fai
Liu, Yu Kuai
Ng, Sheung Mei
Gan, Min
Wong, Lok Wing
Zhao, Jiong
Wang, Zongrong
Cheng, Wang Fai
Huang, Chuanwei
Fei, Linfeng
Mak, Chee Leung
Leung, Chi Wah

DOI
10.1002/admi.202300296
URN
urn:nbn:de:101:1-2023072115242730137913
Rights
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
Last update
14.08.2025, 10:54 AM CEST

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Associated

  • Zhao, Xu Wen
  • Wong, Hon Fai
  • Liu, Yu Kuai
  • Ng, Sheung Mei
  • Gan, Min
  • Wong, Lok Wing
  • Zhao, Jiong
  • Wang, Zongrong
  • Cheng, Wang Fai
  • Huang, Chuanwei
  • Fei, Linfeng
  • Mak, Chee Leung
  • Leung, Chi Wah

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