SEI Growth and Depth Profiling on ZFO Electrodes by Soft X‐Ray Absorption Spectroscopy
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- Extent
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Online-Ressource
- Language
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Englisch
- Bibliographic citation
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SEI Growth and Depth Profiling on ZFO Electrodes by Soft X‐Ray Absorption Spectroscopy ; volume:5 ; number:18 ; year:2015 ; extent:6
Advanced energy materials ; 5, Heft 18 (2015) (gesamt 6)
- Creator
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Di Cicco, Andrea
Giglia, Angelo
Gunnella, Roberto
Koch, Stephan L.
Mueller, Franziska
Nobili, Francesco
Pasqualini, Marta
Passerini, Stefano
Tossici, Roberto
Witkowska, Agnieszka
- DOI
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10.1002/aenm.201500642
- URN
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urn:nbn:de:101:1-2022120405211559773630
- Rights
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Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
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15.08.2025, 7:23 AM CEST
Data provider
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Di Cicco, Andrea
- Giglia, Angelo
- Gunnella, Roberto
- Koch, Stephan L.
- Mueller, Franziska
- Nobili, Francesco
- Pasqualini, Marta
- Passerini, Stefano
- Tossici, Roberto
- Witkowska, Agnieszka