SEI Growth and Depth Profiling on ZFO Electrodes by Soft X‐Ray Absorption Spectroscopy

Location
Deutsche Nationalbibliothek Frankfurt am Main
Extent
Online-Ressource
Language
Englisch

Bibliographic citation
SEI Growth and Depth Profiling on ZFO Electrodes by Soft X‐Ray Absorption Spectroscopy ; volume:5 ; number:18 ; year:2015 ; extent:6
Advanced energy materials ; 5, Heft 18 (2015) (gesamt 6)

Creator
Di Cicco, Andrea
Giglia, Angelo
Gunnella, Roberto
Koch, Stephan L.
Mueller, Franziska
Nobili, Francesco
Pasqualini, Marta
Passerini, Stefano
Tossici, Roberto
Witkowska, Agnieszka

DOI
10.1002/aenm.201500642
URN
urn:nbn:de:101:1-2022120405211559773630
Rights
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
Last update
15.08.2025, 7:23 AM CEST

Data provider

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Associated

  • Di Cicco, Andrea
  • Giglia, Angelo
  • Gunnella, Roberto
  • Koch, Stephan L.
  • Mueller, Franziska
  • Nobili, Francesco
  • Pasqualini, Marta
  • Passerini, Stefano
  • Tossici, Roberto
  • Witkowska, Agnieszka

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