Hochschulschrift

Strain and crystalline defects in epitaxial GaN layers studied by high-resolution X-ray diffraction

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Location: Deutsche Nationalbibliothek Frankfurt am Main

Language: Englisch

Notes: Bremen, Univ., Diss., 2007

Creator: Chierchia, Rosa

URN: urn:nbn:de:gbv:46-diss000114499

Rights: Der Zugriff auf das Objekt ist unbeschränkt möglich.

Last update: 14.08.2025, 10:56 AM CEST

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Hochschulschrift

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Chierchia, Rosa

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Strain and crystalline defects in epitaxial GaN layers studied by high-resolution X-ray diffraction

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