Quantitative determination of the interaction potential between two surfaces using frequency-modulated atomic force microscopy
- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- Extent
-
Online-Ressource
- Language
-
Englisch
- Bibliographic citation
-
Quantitative determination of the interaction potential between two surfaces using frequency-modulated atomic force microscopy ; volume:11 ; pages:729-739
Beilstein journal of nanotechnology ; 11, 729-739
- Classification
-
Ingenieurwissenschaften und Maschinenbau
- DOI
-
10.3762/bjnano.11.60
- URN
-
urn:nbn:de:101:1-2020120215414758756175
- Rights
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
15.08.2025, 7:36 AM CEST
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Other Objects (12)
Bimodal frequency-modulated atomic force microscopy with small cantilevers
Modeling noncontact atomic force microscopy resolution on corrugated surfaces
Coupled molecular and cantilever dynamics model for frequency-modulated atomic force microscopy
Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching : application to rough and natural surfaces
Probing the Mechanical Properties of 2D Materials via Atomic‐Force‐Microscopy‐Based Modulated Nanoindentation
Interactions of multilayer coated surfaces studied by colloidal probe atomic force microscopy
Air–water interface of submerged superhydrophobic surfaces imaged by atomic force microscopy
Defects in oxide surfaces studied by atomic force and scanning tunneling microscopy
A modulated mirror for atomic interferometry
Atomic Force Microscopy (AFM)
Noncontact atomic force microscopy
Atomic Structures and Electronic Properties of Carbide Surfaces Unraveled by Scanning Tunneling Microscopy
Bimodal frequency-modulated atomic force microscopy with small cantilevers
Modeling noncontact atomic force microscopy resolution on corrugated surfaces
Coupled molecular and cantilever dynamics model for frequency-modulated atomic force microscopy
Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching : application to rough and natural surfaces
Probing the Mechanical Properties of 2D Materials via Atomic‐Force‐Microscopy‐Based Modulated Nanoindentation
Interactions of multilayer coated surfaces studied by colloidal probe atomic force microscopy
Air–water interface of submerged superhydrophobic surfaces imaged by atomic force microscopy
Defects in oxide surfaces studied by atomic force and scanning tunneling microscopy
A modulated mirror for atomic interferometry
Atomic Force Microscopy (AFM)
Noncontact atomic force microscopy
Atomic Structures and Electronic Properties of Carbide Surfaces Unraveled by Scanning Tunneling Microscopy
Bimodal frequency-modulated atomic force microscopy with small cantilevers
Modeling noncontact atomic force microscopy resolution on corrugated surfaces
Coupled molecular and cantilever dynamics model for frequency-modulated atomic force microscopy
Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching : application to rough and natural surfaces
Probing the Mechanical Properties of 2D Materials via Atomic‐Force‐Microscopy‐Based Modulated Nanoindentation
Interactions of multilayer coated surfaces studied by colloidal probe atomic force microscopy
Air–water interface of submerged superhydrophobic surfaces imaged by atomic force microscopy
Defects in oxide surfaces studied by atomic force and scanning tunneling microscopy
A modulated mirror for atomic interferometry
Atomic Force Microscopy (AFM)
Noncontact atomic force microscopy