Simultaneously ultrafast and robust two-dimensional flash memory devices based on phase-engineered edge contacts
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- Extent
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1 Online-Ressource.
- Language
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Englisch
- Bibliographic citation
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Simultaneously ultrafast and robust two-dimensional flash memory devices based on phase-engineered edge contacts ; volume:14 ; number:1 ; day:13 ; month:9 ; year:2023 ; pages:1-9 ; date:12.2023
Nature Communications ; 14, Heft 1 (13.9.2023), 1-9, 12.2023
- Creator
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Yu, Jun
Wang, Han
Zhuge, Fuwei
Chen, Zirui
Hu, Man
Xu, Xiang
He, Yuhui
Ma, Ying
Miao, Xiangshui
Zhai, Tianyou
- Contributor
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SpringerLink (Online service)
- DOI
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10.1038/s41467-023-41363-x
- URN
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urn:nbn:de:101:1-2024020210500613132326
- Rights
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Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
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15.08.2025, 7:33 AM CEST
Data provider
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Yu, Jun
- Wang, Han
- Zhuge, Fuwei
- Chen, Zirui
- Hu, Man
- Xu, Xiang
- He, Yuhui
- Ma, Ying
- Miao, Xiangshui
- Zhai, Tianyou
- SpringerLink (Online service)