Effects of Post-Deposition Annealing on ZrO2/n-GaN MOS Capacitors with H2O and O3 as the Oxidizers

Location
Deutsche Nationalbibliothek Frankfurt am Main
ISSN
1556-276X
Extent
Online-Ressource
Language
Englisch
Notes
online resource.

Bibliographic citation
Effects of Post-Deposition Annealing on ZrO2/n-GaN MOS Capacitors with H2O and O3 as the Oxidizers ; volume:12 ; number:1 ; day:11 ; month:4 ; year:2017 ; pages:1-5 ; date:12.2017
Nanoscale research letters ; 12, Heft 1 (11.4.2017), 1-5, 12.2017

Classification
Physik

Creator
Zheng, Meijuan
Contributor
Zhang, Guozhen
Wang, Xiao
Wan, Jiaxian
Wu, Hao
Liu, Chang
SpringerLink (Online service)

DOI
10.1186/s11671-017-2024-x
URN
urn:nbn:de:1111-201704278164
Rights
Der Zugriff auf das Objekt ist unbeschränkt möglich.
Last update
14.08.2025, 10:49 AM CEST

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Associated

  • Zheng, Meijuan
  • Zhang, Guozhen
  • Wang, Xiao
  • Wan, Jiaxian
  • Wu, Hao
  • Liu, Chang
  • SpringerLink (Online service)

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