- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- Extent
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1 Online-Ressource.
- Language
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Englisch
- Bibliographic citation
-
Comparative Study of E-beam and Optical Probing Approaches in Attacking the ICs ; volume:24 ; number:5 ; day:28 ; month:8 ; year:2024 ; pages:2184-2193 ; date:10.2024
Journal of failure analysis and prevention ; 24, Heft 5 (28.8.2024), 2184-2193, 10.2024
- Classification
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Elektrotechnik, Elektronik
- Creator
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Amini, Elham
Jatzkowski, Jörg
Kiyan, Tuba
Renkes, Lars
Krachenfels, Thilo
Tajik, Shahin
Boit, Christian
Altmann, Frank
Brand, Sebastian
Seifert, Jean-Pierre
- Contributor
-
SpringerLink (Online service)
- DOI
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10.1007/s11668-024-02019-0
- URN
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urn:nbn:de:101:1-2502172127430.267830147813
- Rights
-
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
15.08.2025, 7:20 AM CEST
Data provider
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Amini, Elham
- Jatzkowski, Jörg
- Kiyan, Tuba
- Renkes, Lars
- Krachenfels, Thilo
- Tajik, Shahin
- Boit, Christian
- Altmann, Frank
- Brand, Sebastian
- Seifert, Jean-Pierre
- SpringerLink (Online service)