Comparative Study of E-beam and Optical Probing Approaches in Attacking the ICs

Location
Deutsche Nationalbibliothek Frankfurt am Main
Extent
1 Online-Ressource.
Language
Englisch

Bibliographic citation
Comparative Study of E-beam and Optical Probing Approaches in Attacking the ICs ; volume:24 ; number:5 ; day:28 ; month:8 ; year:2024 ; pages:2184-2193 ; date:10.2024
Journal of failure analysis and prevention ; 24, Heft 5 (28.8.2024), 2184-2193, 10.2024

Classification
Elektrotechnik, Elektronik

Creator
Amini, Elham
Jatzkowski, Jörg
Kiyan, Tuba
Renkes, Lars
Krachenfels, Thilo
Tajik, Shahin
Boit, Christian
Altmann, Frank
Brand, Sebastian
Seifert, Jean-Pierre
Contributor
SpringerLink (Online service)

DOI
10.1007/s11668-024-02019-0
URN
urn:nbn:de:101:1-2502172127430.267830147813
Rights
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
Last update
15.08.2025, 7:20 AM CEST

Data provider

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Associated

  • Amini, Elham
  • Jatzkowski, Jörg
  • Kiyan, Tuba
  • Renkes, Lars
  • Krachenfels, Thilo
  • Tajik, Shahin
  • Boit, Christian
  • Altmann, Frank
  • Brand, Sebastian
  • Seifert, Jean-Pierre
  • SpringerLink (Online service)

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