Ellipsometry Study of Hexagonal Boron Nitride Using Synchrotron Radiation: Transparency Window in the Far‐UVC

Location
Deutsche Nationalbibliothek Frankfurt am Main
Extent
Online-Ressource
Language
Englisch

Bibliographic citation
Ellipsometry Study of Hexagonal Boron Nitride Using Synchrotron Radiation: Transparency Window in the Far‐UVC ; year:2021
Advanced photonics research ; (2021)

Creator
Artús, Luis
Feneberg, Martin
Attaccalite, Claudio
Edgar, James H.
Li, Jiahan
Goldhahn, Rüdiger
Cuscó, Ramon

DOI
10.1002/adpr.202000101
URN
urn:nbn:de:101:1-2021031114111094954567
Rights
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
Last update
15.08.2025, 7:32 AM CEST

Data provider

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Associated

  • Artús, Luis
  • Feneberg, Martin
  • Attaccalite, Claudio
  • Edgar, James H.
  • Li, Jiahan
  • Goldhahn, Rüdiger
  • Cuscó, Ramon

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