Measurement uncertainties in I–V calibration of multi-junction solar cells for different solar simulators and reference devices

Abstract: Different types of dual-junction solar cells (perovskite/silicon and GaInP/(Al)GaAs) are used in an investigation of measurement uncertainty for electrical characterization of multijunction solar cells. A method traceable to international reference standards is presented. The spectral mismatch factor matrix is introduced and used with a Monte-Carlo method including manifold correlated and uncorrelated uncertainties. In this way, a detailed analysis of the solar simulator’s spectral irradiance and its influence on uncertainty becomes possible. The use of subcelladapted and broadband reference solar cells is addressed regarding their impact on uncertainty. This allows for finding optimal conditions for calibration with lowest measurement uncertainty. The short-circuit current ofa series connected multi-junction solar cell is affected by luminescence coupling and other effects. With an experimental method it is shown how the uncertainty of the device short-circuit current can be precisely determined. The spectrometric characterization method allows deriving uncertainties of all I–V parameters. In this way a complete evaluation of measurement uncertainty for the calibration of multi-junction solar cells at standard testing conditions is introduced. This article is an extension to our work presented at the 46th IEEE PVSC. Here, we have added a detailed analysis of the influence of different solar simulator spectral irradiance distributions on measurement uncertainty by evaluating a Monte Carlo simulation introducing correlation coefficients. In addition for the first time, it is shownhow luminescent coupling influences the calibration of multi-junction solar cells and how the effect needs to be implemented into the uncertainty of measurement for the short-circuit current as well as efficiency

Object Details

• Location: Deutsche Nationalbibliothek Frankfurt am Main
• Extent: Online-Ressource
• Language: Englisch
• Notes: IEEE journal of photovoltaics. - 10, 4 (2020) , 1076-1083, ISSN: 2156-3403

Classification and Topics

• Keyword: Solarzelle ; Unsicherheit ; Messunsicherheit ; Kalibrieren ; Kurzschlussstrom ; Halbleiterbauelement ; Beschränkung

Contributors, Places and Time

• Event: Veröffentlichung
• (where): Freiburg
• (who): Universität
• (when): 2020
• Creator: Reichmuth, S. Kasimir ; Siefer, Gerald ; Schachtner, Michael ; Muhleis, Matthias ; Hohl-Ebinger, Jochen ; Glunz, Stefan

Further information

• DOI: 10.1109/JPHOTOV.2020.2989144
• URN: urn:nbn:de:bsz:25-freidok-1658653
• Rights: Der Zugriff auf das Objekt ist unbeschränkt möglich.
• Last update: 14.08.2025, 11:02 AM CEST