Fringe pattern analysis for optical metrology : theory, algorithms, and applications
- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISBN
-
9783527411528
3527411526
- Maße
-
25 cm
- Umfang
-
XVI, 327 S.
- Sprache
-
Englisch
- Anmerkungen
-
Ill., graph. Darst.
Literaturangaben
- Schlagwort
-
Metrologie
Optische Messtechnik
- Ereignis
-
Veröffentlichung
- (wo)
-
Weinheim
- (wer)
-
Wiley-VCH
- (wann)
-
2014
- Urheber
- Inhaltsverzeichnis
- Rechteinformation
-
Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
- Letzte Aktualisierung
-
11.06.2025, 13:45 MESZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
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Beteiligte
Entstanden
- 2014
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