Quantifying the Reliability Performance of a Guided Wave-Based SHM System Using Piezoelectric Wafer Actuator Sensors

Location
Deutsche Nationalbibliothek Frankfurt am Main
Extent
Online-Ressource
Language
Englisch

Bibliographic citation
Quantifying the Reliability Performance of a Guided Wave-Based SHM System Using Piezoelectric Wafer Actuator Sensors ; volume:29 ; number:7 ; year:2024
E-Journal of nondestructive testing ; 29, Heft 7 (2024)

Creator
Eiras, Jesus N.
Gavérina, Ludovic
Mastromatteo, Loïc
Roche, Jean-Michel

DOI
10.58286/29867
URN
urn:nbn:de:101:1-2502041154578.636693610377
Rights
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
Last update
15.08.2025, 7:20 AM CEST

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Associated

  • Eiras, Jesus N.
  • Gavérina, Ludovic
  • Mastromatteo, Loïc
  • Roche, Jean-Michel

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