Trustworthy and intelligent fault diagnosis with effective denoising and evidential stacked GRU neural network

Location
Deutsche Nationalbibliothek Frankfurt am Main
Extent
1 Online-Ressource.
Language
Englisch

Bibliographic citation
Trustworthy and intelligent fault diagnosis with effective denoising and evidential stacked GRU neural network ; day:12 ; month:10 ; year:2023 ; pages:1-20
Journal of intelligent manufacturing ; (12.10.2023), 1-20

Classification
Elektrotechnik, Elektronik

Creator
Zhou, Hanting
Chen, Wenhe
Liu, Jing
Cheng, Longsheng
Xia, Min
Contributor
SpringerLink (Online service)

DOI
10.1007/s10845-023-02221-1
URN
urn:nbn:de:101:1-2024010121141672222410
Rights
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
Last update
15.08.2025, 7:21 AM CEST

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Associated

  • Zhou, Hanting
  • Chen, Wenhe
  • Liu, Jing
  • Cheng, Longsheng
  • Xia, Min
  • SpringerLink (Online service)

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