Trustworthy and intelligent fault diagnosis with effective denoising and evidential stacked GRU neural network
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- Extent
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1 Online-Ressource.
- Language
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Englisch
- Bibliographic citation
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Trustworthy and intelligent fault diagnosis with effective denoising and evidential stacked GRU neural network ; day:12 ; month:10 ; year:2023 ; pages:1-20
Journal of intelligent manufacturing ; (12.10.2023), 1-20
- Classification
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Elektrotechnik, Elektronik
- Creator
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Zhou, Hanting
Chen, Wenhe
Liu, Jing
Cheng, Longsheng
Xia, Min
- Contributor
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SpringerLink (Online service)
- DOI
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10.1007/s10845-023-02221-1
- URN
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urn:nbn:de:101:1-2024010121141672222410
- Rights
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Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
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15.08.2025, 7:21 AM CEST
Data provider
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Zhou, Hanting
- Chen, Wenhe
- Liu, Jing
- Cheng, Longsheng
- Xia, Min
- SpringerLink (Online service)