Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reduction
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- Extent
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Online-Ressource
- Bibliographic citation
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Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reduction ; volume:3 ; pages:637-650
Beilstein journal of nanotechnology ; 3, 637-650
- Classification
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Ingenieurwissenschaften und Maschinenbau
- DOI
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10.3762/bjnano.3.73
- URN
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urn:nbn:de:101:1-201210164665
- Rights
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Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
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15.08.2025, 7:31 AM CEST
Data provider
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