- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
-
Online-Ressource
- Sprache
-
Englisch
- Anmerkungen
-
Oldenburg, Univ., Diss., 2009
- Klassifikation
-
Elektrotechnik, Elektronik
- Schlagwort
-
Leckstrom ; Makrosimulation ; Verlustleistung ; Abschätzung
- Urheber
- URN
-
urn:nbn:de:gbv:715-oops-9825
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
- 15.08.2025, 07:36 MESZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
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Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Objekttyp
- Hochschulschrift
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