Quantification of area-selective deposition on nanometer-scale patterns using Rutherford backscattering spectrometry

Location
Deutsche Nationalbibliothek Frankfurt am Main
ISSN
2045-2322
Extent
Online-Ressource
Language
Englisch
Notes
online resource.

Bibliographic citation
Quantification of area-selective deposition on nanometer-scale patterns using Rutherford backscattering spectrometry ; volume:12 ; number:1 ; day:22 ; month:10 ; year:2022 ; pages:1-8 ; date:12.2022
Scientific reports ; 12, Heft 1 (22.10.2022), 1-8, 12.2022

Creator
Claessens, Niels
Khan, Zamran Zahoor
Haghighi, Negin Rahnemai
Delabie, Annelies
Vantomme, André
Vandervorst, Wilfried
Meersschaut, Johan
Contributor
SpringerLink (Online service)

DOI
10.1038/s41598-022-22645-8
URN
urn:nbn:de:101:1-2023010621120202439888
Rights
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
Last update
15.08.2025, 7:32 AM CEST

Data provider

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Associated

  • Claessens, Niels
  • Khan, Zamran Zahoor
  • Haghighi, Negin Rahnemai
  • Delabie, Annelies
  • Vantomme, André
  • Vandervorst, Wilfried
  • Meersschaut, Johan
  • SpringerLink (Online service)

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