Hochschulschrift
In-operando hard X-ray photoelectron spectroscopy study on the resistive switching physics of HfO2-based RRAM
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- Dimensions
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30 cm
- Extent
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XIV, 162 S.
- Language
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Englisch
- Notes
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Ill., graph. Darst.
Cottbus-Senftenberg, Techn. Univ., Diss. 2014 (Nicht für den Austausch)
- Keyword
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Röntgenspektroskopie
Defekt
FRAM
- Creator
- Table of contents
- Rights
-
Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
- Last update
-
11.06.2025, 1:45 PM CEST
Data provider
This object is provided by:
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Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Object type
- Hochschulschrift
Associated
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