- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- Extent
-
Online-Ressource
- Language
-
Englisch
- Notes
-
Karlsruhe, Karlsruher Institut für Technologie (KIT), Dissertation, 2022
- Classification
-
Elektrotechnik, Elektronik
- Keyword
-
Zuverlässigkeit
Degradation
CMOS
Schaltungsentwurf
MOS-FET
Entwurfsautomation
- Event
-
Veröffentlichung
- (where)
-
Karlsruhe
- (who)
-
KIT-Bibliothek
- (when)
-
2023
- Creator
- Contributor
-
Henkel, Jörg
Amrouch, Hussam
Schlichtmann, Ulf
- DOI
-
10.5445/IR/1000158506
- URN
-
urn:nbn:de:101:1-2023052405002040095038
- Rights
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
14.08.2025, 11:01 AM CEST
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Van Santen, Victor
- Henkel, Jörg
- Amrouch, Hussam
- Schlichtmann, Ulf
- KIT-Bibliothek
Time of origin
- 2023
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