Overcoming diffusion-related limitations in semiconductor defect imaging with phonon-plasmon-coupled mode Raman scattering

Location
Deutsche Nationalbibliothek Frankfurt am Main
ISSN
2047-7538
Extent
Online-Ressource
Language
Englisch
Notes
online resource.

Bibliographic citation
Overcoming diffusion-related limitations in semiconductor defect imaging with phonon-plasmon-coupled mode Raman scattering ; volume:7 ; number:1 ; day:20 ; month:6 ; year:2018 ; pages:1-8 ; date:12.2018
Light ; 7, Heft 1 (20.6.2018), 1-8, 12.2018

Classification
Physik

Creator
Hu, Changkui
Contributor
Chen, Qiong
Chen, Fengxiang
Gfroerer, T. H.
Wanlass, M. W.
Zhang, Yong
SpringerLink (Online service)

DOI
10.1038/s41377-018-0016-y
URN
urn:nbn:de:101:1-2018082500243303277264
Rights
Der Zugriff auf das Objekt ist unbeschränkt möglich.
Last update
15.08.2025, 7:24 AM CEST

Data provider

This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.

Associated

  • Hu, Changkui
  • Chen, Qiong
  • Chen, Fengxiang
  • Gfroerer, T. H.
  • Wanlass, M. W.
  • Zhang, Yong
  • SpringerLink (Online service)

Other Objects (12)