Overcoming diffusion-related limitations in semiconductor defect imaging with phonon-plasmon-coupled mode Raman scattering
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- ISSN
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2047-7538
- Extent
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Online-Ressource
- Language
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Englisch
- Notes
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online resource.
- Bibliographic citation
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Overcoming diffusion-related limitations in semiconductor defect imaging with phonon-plasmon-coupled mode Raman scattering ; volume:7 ; number:1 ; day:20 ; month:6 ; year:2018 ; pages:1-8 ; date:12.2018
Light ; 7, Heft 1 (20.6.2018), 1-8, 12.2018
- Classification
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Physik
- Creator
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Hu, Changkui
- Contributor
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Chen, Qiong
Chen, Fengxiang
Gfroerer, T. H.
Wanlass, M. W.
Zhang, Yong
SpringerLink (Online service)
- DOI
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10.1038/s41377-018-0016-y
- URN
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urn:nbn:de:101:1-2018082500243303277264
- Rights
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Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
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15.08.2025, 7:24 AM CEST
Data provider
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Hu, Changkui
- Chen, Qiong
- Chen, Fengxiang
- Gfroerer, T. H.
- Wanlass, M. W.
- Zhang, Yong
- SpringerLink (Online service)