- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- Extent
-
Online-Ressource
- Language
-
Englisch
- Bibliographic citation
-
In: Haase, F.; Rojas, E.G.; Bothe, K.; Brendel, Rolf: Layer selective laser ablation for local contacts to thin emitters. In: Energy Procedia 8 (2011), S. 577-580. DOI: https://doi.org/10.1016/j.egypro.2011.06.185
- Event
-
Veröffentlichung
- (where)
-
Hannover
- (who)
-
Gottfried Wilhelm Leibniz Universität Hannover
- (when)
-
2011
- Event
-
Veröffentlichung
- (where)
-
Hannover
- (who)
-
Technische Informationsbibliothek (TIB)
- (when)
-
2011
- Creator
-
Haase, Felix
Rojas, Enrique Garralaga
Bothe, Karsten
Brendel, Rolf
- DOI
-
10.15488/1154
- URN
-
urn:nbn:de:101:1-2020071506154023922718
- Rights
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
14.08.2025, 10:53 AM CEST
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Haase, Felix
- Rojas, Enrique Garralaga
- Bothe, Karsten
- Brendel, Rolf
- Gottfried Wilhelm Leibniz Universität Hannover
- Technische Informationsbibliothek (TIB)
Time of origin
- 2011
Other Objects (12)
Das Schweizer Plakat : Versuch e. systemat. Darst. d. Gestaltungsformen, d. Werbewirkg u. d. kulturpolit. Bedeutg d. Plakats am Beisp. d. Plakatschaffens d. Schweiz
Physical limitations to crystalline thin film silicon solar cells
Das Energiesystem verstehen
Die Wärmepumpe : Dreh- und Angelpunkt der Wärmewende
BBr3 boron diffusion process for p+-Emitter formation of n-type silicon solar cells
Thermomechanics of photovoltaic modules
Recombination at local aluminum-alloyed silicon solar cell base contacts by dynamic infrared lifetime mapping
Failure stress of epitaxial silicon thin films
Analysis and optimization of the bulk and rear recombination of screen-printed PERC solar cells
Lifetime Analysis for Defect Characterization in Kerfless Epitaxial Silicon from the Porous Silicon Process
Dynamic photoluminescence lifetime imaging for injectiondependent lifetime measurements
Fineline printing options for high efficiencies and low Ag paste consumption
Das Schweizer Plakat : Versuch e. systemat. Darst. d. Gestaltungsformen, d. Werbewirkg u. d. kulturpolit. Bedeutg d. Plakats am Beisp. d. Plakatschaffens d. Schweiz
Physical limitations to crystalline thin film silicon solar cells
Das Energiesystem verstehen
Die Wärmepumpe : Dreh- und Angelpunkt der Wärmewende
BBr3 boron diffusion process for p+-Emitter formation of n-type silicon solar cells
Thermomechanics of photovoltaic modules
Recombination at local aluminum-alloyed silicon solar cell base contacts by dynamic infrared lifetime mapping
Failure stress of epitaxial silicon thin films
Analysis and optimization of the bulk and rear recombination of screen-printed PERC solar cells
Lifetime Analysis for Defect Characterization in Kerfless Epitaxial Silicon from the Porous Silicon Process
Dynamic photoluminescence lifetime imaging for injectiondependent lifetime measurements
Fineline printing options for high efficiencies and low Ag paste consumption
Das Schweizer Plakat : Versuch e. systemat. Darst. d. Gestaltungsformen, d. Werbewirkg u. d. kulturpolit. Bedeutg d. Plakats am Beisp. d. Plakatschaffens d. Schweiz
Physical limitations to crystalline thin film silicon solar cells
Das Energiesystem verstehen
Die Wärmepumpe : Dreh- und Angelpunkt der Wärmewende
BBr3 boron diffusion process for p+-Emitter formation of n-type silicon solar cells
Thermomechanics of photovoltaic modules
Recombination at local aluminum-alloyed silicon solar cell base contacts by dynamic infrared lifetime mapping
Failure stress of epitaxial silicon thin films
Analysis and optimization of the bulk and rear recombination of screen-printed PERC solar cells
Lifetime Analysis for Defect Characterization in Kerfless Epitaxial Silicon from the Porous Silicon Process
Dynamic photoluminescence lifetime imaging for injectiondependent lifetime measurements