Terahertz Multilayer Thickness Measurements: Comparison of Optoelectronic Time and Frequency Domain Systems
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- ISSN
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1866-6906
- Extent
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Online-Ressource
- Language
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Englisch
- Notes
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online resource.
- Bibliographic citation
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Terahertz Multilayer Thickness Measurements: Comparison of Optoelectronic Time and Frequency Domain Systems ; volume:42 ; number:11-12 ; day:8 ; month:12 ; year:2021 ; pages:1153-1167 ; date:11.2021
Journal of infrared, millimeter, and terahertz waves ; 42, Heft 11-12 (8.12.2021), 1153-1167, 11.2021
- Creator
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Liebermeister, Lars
Nellen, Simon
Kohlhaas, Robert B.
Lauck, Sebastian
Deumer, Milan
Breuer, Steffen
Schell, Martin
Globisch, Björn
- Contributor
-
SpringerLink (Online service)
- DOI
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10.1007/s10762-021-00831-5
- URN
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urn:nbn:de:101:1-2022042619031886155670
- Rights
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Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
15.08.2025, 7:21 AM CEST
Data provider
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Associated
- Liebermeister, Lars
- Nellen, Simon
- Kohlhaas, Robert B.
- Lauck, Sebastian
- Deumer, Milan
- Breuer, Steffen
- Schell, Martin
- Globisch, Björn
- SpringerLink (Online service)
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