Development, Psychometric Validation and Responder Definition of Worst Itch Scale in Children with Severe Atopic Dermatitis
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- ISSN
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2190-9172
- Extent
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Online-Ressource
- Language
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Englisch
- Notes
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online resource.
- Bibliographic citation
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Development, Psychometric Validation and Responder Definition of Worst Itch Scale in Children with Severe Atopic Dermatitis ; volume:12 ; number:12 ; day:21 ; month:10 ; year:2022 ; pages:2839-2850 ; date:12.2022
Dermatology and therapy ; 12, Heft 12 (21.10.2022), 2839-2850, 12.2022
- Creator
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Paller, Amy S.
Yosipovitch, Gil
Weidinger, Stephan
DiBenedetti, Dana
Whalley, Diane
Gadkari, Abhijit
Guillemin, Isabelle
Zhang, Haixin
Eckert, Laurent
Chao, Jingdong
Bansal, Ashish
Chuang, Chien-Chia
Delevry, Dimittri
- Contributor
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SpringerLink (Online service)
- DOI
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10.1007/s13555-022-00804-z
- URN
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urn:nbn:de:101:1-2023013121114772439636
- Rights
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Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
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15.08.2025, 7:20 AM CEST
Data provider
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Paller, Amy S.
- Yosipovitch, Gil
- Weidinger, Stephan
- DiBenedetti, Dana
- Whalley, Diane
- Gadkari, Abhijit
- Guillemin, Isabelle
- Zhang, Haixin
- Eckert, Laurent
- Chao, Jingdong
- Bansal, Ashish
- Chuang, Chien-Chia
- Delevry, Dimittri
- SpringerLink (Online service)