Temperature-Dependent HfO2/Si Interface Structural Evolution and its Mechanism

Location
Deutsche Nationalbibliothek Frankfurt am Main
ISSN
1556-276X
Extent
Online-Ressource
Language
Englisch
Notes
online resource.

Bibliographic citation
Temperature-Dependent HfO2/Si Interface Structural Evolution and its Mechanism ; volume:14 ; number:1 ; day:7 ; month:3 ; year:2019 ; pages:1-8 ; date:12.2019
Nanoscale research letters ; 14, Heft 1 (7.3.2019), 1-8, 12.2019

Creator
Zhang, Xiao-Ying
Hsu, Chia-Hsun
Lien, Shui-Yang
Wu, Wan-Yu
Ou, Sin-Liang
Chen, Song-Yan
Huang, Wei
Zhu, Wen-Zhang
Xiong, Fei-Bing
Zhang, Sam
Contributor
SpringerLink (Online service)

DOI
10.1186/s11671-019-2915-0
URN
urn:nbn:de:101:1-2019033116580159761441
Rights
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
Last update
14.08.2025, 10:47 AM CEST

Data provider

This object is provided by:
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Associated

  • Zhang, Xiao-Ying
  • Hsu, Chia-Hsun
  • Lien, Shui-Yang
  • Wu, Wan-Yu
  • Ou, Sin-Liang
  • Chen, Song-Yan
  • Huang, Wei
  • Zhu, Wen-Zhang
  • Xiong, Fei-Bing
  • Zhang, Sam
  • SpringerLink (Online service)

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