Microstructure characterization of BaSnO3 thin films on LaAlO3 and PrScO3 substrates from transmission electron microscopy
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- ISSN
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2045-2322
- Extent
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Online-Ressource
- Language
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Englisch
- Notes
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online resource.
- Bibliographic citation
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Microstructure characterization of BaSnO3 thin films on LaAlO3 and PrScO3 substrates from transmission electron microscopy ; volume:8 ; number:1 ; day:6 ; month:7 ; year:2018 ; pages:1-10 ; date:12.2018
Scientific reports ; 8, Heft 1 (6.7.2018), 1-10, 12.2018
- Creator
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Yun, Hwanhui
- Contributor
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Ganguly, Koustav
Postiglione, William
Jalan, Bharat
Leighton, Chris
Mkhoyan, K. Andre
Jeong, Jong Seok
SpringerLink (Online service)
- DOI
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10.1038/s41598-018-28520-9
- URN
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urn:nbn:de:101:1-2019011011334115371122
- Rights
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Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
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14.08.2025, 11:01 AM CEST
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Yun, Hwanhui
- Ganguly, Koustav
- Postiglione, William
- Jalan, Bharat
- Leighton, Chris
- Mkhoyan, K. Andre
- Jeong, Jong Seok
- SpringerLink (Online service)
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