Multiscale in-situ characterization of static recrystallization using dark-field X-ray microscopy and high-resolution X-ray diffraction

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Standort: Deutsche Nationalbibliothek Frankfurt am Main

Umfang: 1 Online-Ressource.

Sprache: Englisch

Erschienen in: Multiscale in-situ characterization of static recrystallization using dark-field X-ray microscopy and high-resolution X-ray diffraction ; volume:14 ; number:1 ; day:14 ; month:3 ; year:2024 ; pages:1-13 ; date:12.2024
Scientific reports ; 14, Heft 1 (14.3.2024), 1-13, 12.2024

Urheber: Lee, Sangwon
Berman, Tracy D.
Yildirim, Can
Detlefs, Carsten
Allison, John E.
Bucsek, Ashley

Beteiligte Personen und Organisationen: SpringerLink (Online service)

DOI: 10.1038/s41598-024-56546-9

URN: urn:nbn:de:101:1-2405162112479.174454846385

Rechteinformation: Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.

Letzte Aktualisierung: 14.08.2025, 10:45 MESZ

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Beteiligte

Lee, Sangwon
Berman, Tracy D.
Yildirim, Can
Detlefs, Carsten
Allison, John E.
Bucsek, Ashley
SpringerLink (Online service)

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Multiscale in-situ characterization of static recrystallization using dark-field X-ray microscopy and high-resolution X-ray diffraction

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