Extended-depth of field random illumination microscopy, EDF-RIM, provides super-resolved projective imaging

Object Details

• Location: Deutsche Nationalbibliothek Frankfurt am Main
• Extent: 1 Online-Ressource.
• Language: Englisch

References and Relationships

• Bibliographic citation: Extended-depth of field random illumination microscopy, EDF-RIM, provides super-resolved projective imaging ; volume:13 ; number:1 ; day:10 ; month:10 ; year:2024 ; pages:1-12 ; date:12.2024 ; Light ; 13, Heft 1 (10.10.2024), 1-12, 12.2024

Classification and Topics

• Classification: Elektrotechnik, Elektronik

Contributors, Places and Time

• Creator: Mazzella, Lorry ; Mangeat, Thomas ; Giroussens, Guillaume ; Rogez, Benoit ; Li, Hao ; Creff, Justine ; Saadaoui, Mehdi ; Martins, Carla ; Bouzignac, Ronan ; Labouesse, Simon ; Idier, Jérome ; Galland, Frédéric ; Allain, Marc ; Sentenac, Anne ; LeGoff, Loïc
• Contributor: SpringerLink (Online service)

Further information

• DOI: 10.1038/s41377-024-01612-0
• URN: urn:nbn:de:101:1-2412272059248.487006214676
• Rights: Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
• Last update: 15.08.2025, 7:29 AM CEST