Bimodal atomic force microscopy driving the higher eigenmode in frequency-modulation mode: Implementation, advantages, disadvantages and comparison to the open-loop case

Location
Deutsche Nationalbibliothek Frankfurt am Main
Extent
Online-Ressource

Bibliographic citation
Bimodal atomic force microscopy driving the higher eigenmode in frequency-modulation mode: Implementation, advantages, disadvantages and comparison to the open-loop case ; volume:4 ; pages:198-207
Beilstein journal of nanotechnology ; 4, 198-207

Classification
Ingenieurwissenschaften und Maschinenbau

DOI
10.3762/bjnano.4.20
URN
urn:nbn:de:101:1-2013062610759
Rights
Der Zugriff auf das Objekt ist unbeschränkt möglich.
Last update
14.08.2025, 11:02 AM CEST

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