Detection of Subsurface, Nanometer‐Scale Crystallographic Defects by Nonlinear Light Scattering and Localization
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- Extent
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Online-Ressource
- Language
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Englisch
- Bibliographic citation
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Detection of Subsurface, Nanometer‐Scale Crystallographic Defects by Nonlinear Light Scattering and Localization ; day:06 ; month:06 ; year:2021 ; extent:8
Advanced optical materials ; (06.06.2021) (gesamt 8)
- Creator
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Shafiei, Farbod
Orzali, Tommaso
Vert, Alexey
Miri, Mohammad‐Ali
Hung, Pui Yee
Wong, Man Hoi
Alù, Andrea
Bersuker, Gennadi
Downer, Michael C.
- DOI
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10.1002/adom.202002252
- URN
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urn:nbn:de:101:1-2021060708592532862857
- Rights
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Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
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14.08.2025, 10:48 AM CEST
Data provider
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Shafiei, Farbod
- Orzali, Tommaso
- Vert, Alexey
- Miri, Mohammad‐Ali
- Hung, Pui Yee
- Wong, Man Hoi
- Alù, Andrea
- Bersuker, Gennadi
- Downer, Michael C.