Optical examination of high contrast grating fabricated by focused-ion beam etching
- Standort
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Deutsche Nationalbibliothek Frankfurt am Main
- ISSN
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1572-817X
- Umfang
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Online-Ressource
- Sprache
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Englisch
- Anmerkungen
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online resource.
- Erschienen in
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Optical examination of high contrast grating fabricated by focused-ion beam etching ; volume:48 ; number:4 ; day:31 ; month:3 ; year:2016 ; pages:1-9 ; date:4.2016
Optical and quantum electronics ; 48, Heft 4 (31.3.2016), 1-9, 4.2016
- Urheber
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Urbańczyk, Dominika
- Beteiligte Personen und Organisationen
-
Wójcik-Jedlińska, Anna
Muszalski, Jan
Łaszcz, Adam
Płuska, Mariusz
Gębski, Marcin
Czyszanowski, Tomasz
Czerwinski, Andrzej
Bugajski, Maciej
SpringerLink (Online service)
- DOI
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10.1007/s11082-016-0544-8
- URN
-
urn:nbn:de:1111-2016040120380
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
14.08.2025, 11:00 MESZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
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Beteiligte
- Urbańczyk, Dominika
- Wójcik-Jedlińska, Anna
- Muszalski, Jan
- Łaszcz, Adam
- Płuska, Mariusz
- Gębski, Marcin
- Czyszanowski, Tomasz
- Czerwinski, Andrzej
- Bugajski, Maciej
- SpringerLink (Online service)
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