Comparative Analysis of Defects in Mg-Implanted and Mg-Doped GaN Layers on Freestanding GaN Substrates
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- ISSN
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1556-276X
- Extent
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Online-Ressource
- Language
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Englisch
- Notes
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online resource.
- Bibliographic citation
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Comparative Analysis of Defects in Mg-Implanted and Mg-Doped GaN Layers on Freestanding GaN Substrates ; volume:13 ; number:1 ; day:11 ; month:12 ; year:2018 ; pages:1-8 ; date:12.2018
Nanoscale research letters ; 13, Heft 1 (11.12.2018), 1-8, 12.2018
- Creator
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Kumar, Ashutosh
Mitsuishi, Kazutaka
Hara, Toru
Kimoto, Koji
Irokawa, Yoshihiro
Nabatame, Toshihide
Takashima, Shinya
Ueno, Katsunori
Edo, Masaharu
Koide, Yasuo
- Contributor
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SpringerLink (Online service)
- DOI
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10.1186/s11671-018-2804-y
- URN
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urn:nbn:de:101:1-2019012715192366395139
- Rights
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Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
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14.08.2025, 10:48 AM CEST
Data provider
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Kumar, Ashutosh
- Mitsuishi, Kazutaka
- Hara, Toru
- Kimoto, Koji
- Irokawa, Yoshihiro
- Nabatame, Toshihide
- Takashima, Shinya
- Ueno, Katsunori
- Edo, Masaharu
- Koide, Yasuo
- SpringerLink (Online service)