Comparative Analysis of Defects in Mg-Implanted and Mg-Doped GaN Layers on Freestanding GaN Substrates

Location
Deutsche Nationalbibliothek Frankfurt am Main
ISSN
1556-276X
Extent
Online-Ressource
Language
Englisch
Notes
online resource.

Bibliographic citation
Comparative Analysis of Defects in Mg-Implanted and Mg-Doped GaN Layers on Freestanding GaN Substrates ; volume:13 ; number:1 ; day:11 ; month:12 ; year:2018 ; pages:1-8 ; date:12.2018
Nanoscale research letters ; 13, Heft 1 (11.12.2018), 1-8, 12.2018

Creator
Kumar, Ashutosh
Mitsuishi, Kazutaka
Hara, Toru
Kimoto, Koji
Irokawa, Yoshihiro
Nabatame, Toshihide
Takashima, Shinya
Ueno, Katsunori
Edo, Masaharu
Koide, Yasuo
Contributor
SpringerLink (Online service)

DOI
10.1186/s11671-018-2804-y
URN
urn:nbn:de:101:1-2019012715192366395139
Rights
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
Last update
14.08.2025, 10:48 AM CEST

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Associated

  • Kumar, Ashutosh
  • Mitsuishi, Kazutaka
  • Hara, Toru
  • Kimoto, Koji
  • Irokawa, Yoshihiro
  • Nabatame, Toshihide
  • Takashima, Shinya
  • Ueno, Katsunori
  • Edo, Masaharu
  • Koide, Yasuo
  • SpringerLink (Online service)

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